000 00833pam a2200253 a 4500
999 _c1536
_d1536
001 2420702
003 KE-NaNDC
005 20230128183337.0
008 870513s1988 njua b 001 0 eng
010 _a 87003501
020 _a0134988663 :
_c$27.75
040 _aDLC
_cDLC
_dDLC
050 0 0 _aTK7874
_b.F48 1988
082 0 0 _a621.395
_219
100 1 _aFeugate, Robert J.,
_d1946-
245 1 0 _aIntroduction to VLSI testing /
_cRobert J. Feugate, Jr., Steven M. McIntyre.
260 _aEnglewood Cliffs, N.J. :
_bPrentice Hall,
_cc1988.
300 _axiii, 226 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographies and index.
650 0 _aIntegrated circuits
_xVery large scale integration
_xTesting.
700 1 _aMcIntyre, Steven M.,
_d1958-
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2lcc
_cBK